Ieee 15th international conference on design & technology of integrated systems in nanoscale era

The aim of the Conference is to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products.

The papers accepted to the conference will appear in formal IEEE proceedings. An extended version or developments of the accepted papers will be invited to participate to a special issue of the Microelectronics Reliability Journal by Elsevier editor.